@inproceedings{a0324bf08f664f9b9c41f955f6bd4c14,
title = "The impact of FinFET technology scaling on critical path performance under process variations",
abstract = "Comparisons of FinFET based ring oscillator (RO) metrics are evaluated with technology scaling from 20nm to 7nm technology. Simulations are based on predictive technology models (PTM) developed by Arizona state university. The impact of process and temperature variations on frequency, power, and power delay product is reported. Performance and power of the RO are improved with technology scaling, however performance is degraded after 14nm technology.",
keywords = "Nano-scale FinFET, Process variations, Ring Oscillator",
author = "Osama Abdelkader and Hassan Mostafa and Hamdy Abdelhamid and Ahmed Soliman",
note = "Publisher Copyright: {\textcopyright} 2015 IEEE.; 5th International Conference on Energy Aware Computing Systems and Applications, ICEAC 2015 ; Conference date: 24-03-2015 Through 26-03-2015",
year = "2015",
month = dec,
day = "9",
doi = "10.1109/ICEAC.2015.7352194",
language = "English",
series = "5th International Conference on Energy Aware Computing Systems and Applications, ICEAC 2015",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
booktitle = "5th International Conference on Energy Aware Computing Systems and Applications, ICEAC 2015",
address = "United States",
}