Skip to main navigation Skip to search Skip to main content

Sensitivity of microwave power transistors to low frequency impedance variations

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

1 Scopus citations

Abstract

Low frequency impedance variations have been identified as having an adverse effect on the linearity performance of microwave power transistors. The presentation of frequency independent and broadband low frequency impedances across the wide modulation bandwidth is of paramount significance for robust characterization of microwave power transistors for future wireless communication systems. This paper presents a refined active loadpull measurement system to allow the precise independent control of all the significant low frequency components generated as a result of complex modulated excitation. The investigations are carried out on a 10W pHEMT microwave power transistor when driven to deliver a peak envelope power of approximately 39.7dBm under 9-tone complex modulated stimulus.

Original languageEnglish
Title of host publicationProceedings - 2019 6th International Conference on Electrical and Electronics Engineering, ICEEE 2019
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages237-240
Number of pages4
ISBN (Electronic)9781728139104
DOIs
StatePublished - Apr 2019
Event6th International Conference on Electrical and Electronics Engineering, ICEEE 2019 - Istanbul, Turkey
Duration: 16 Apr 201917 Apr 2019

Publication series

NameProceedings - 2019 6th International Conference on Electrical and Electronics Engineering, ICEEE 2019

Conference

Conference6th International Conference on Electrical and Electronics Engineering, ICEEE 2019
Country/TerritoryTurkey
CityIstanbul
Period16/04/1917/04/19

Keywords

  • Active load-pull
  • Broadband
  • Impedance
  • Low frequency

Fingerprint

Dive into the research topics of 'Sensitivity of microwave power transistors to low frequency impedance variations'. Together they form a unique fingerprint.

Cite this