Sampling of complex modulated stimuli using digital sampling oscilloscope

This paper reports on the sampling method that is employed to ensure the most efficient capture of complex modulated stimuli using a standard digital sampling oscilloscope. To demonstrate the sampling method, the system is fully calibrated to the device plane, with vector error correction being applied to the measured data, ensuring any dispersion of the connecting hardware is removed. A Gallium Nitride (GaN) transistor has been measured, and results are presented that highlight the importance of measurement, analysis and optimization of baseband electrical memory, and reduction of inherent non-linearity of the device under complex modulated stimuli.