Retraction notice to "Optical and electronic properties for As-60 at.% S uniform thickness of thin films: Influence of Se content" (Optical Materials (2020) 109 (110257) DOI: 10.1016/j.optmat.2020.110257)

This article has been retracted: please see Elsevier Policy on Article Withdrawal (https://www.elsevier.com/about/policies/article-with drawal). At the request of the Editor-in-Chief, this article, "Optical and electronic properties for As-60 at.% S uniform thickness of thin films: Influence of Se content,"Optical Materials, Volume 109, November 2020, 110257, has been retracted. In Fig. 2 XRD traces, the spectra for the 15 %, 45 %, and 60 % samples were found to be identical to the level of the instrumental noise. This exactness is not physically possible given the stochastic nature of noise. Therefore, the EiC no longer has confidence in the authenticity of the data. In accordance with the journal s publishing policy, the article is retracted. The authors disagree with the retraction and dispute the grounds for it.