Point source scattering by a metallic half-plane

S. Asghar; Tasawar Hayat

Point source scattering by a metallic half-plane

S. Asghar
, Tasawar Hayat

Quaid-I-Azam University

Research output: Contribution to journal › Article › peer-review

2 Scopus citations

Abstract

The diffraction of an E-polarized and an H-polarized spherical wave (emanating from a point source) by an imperfectly conducting half-plane (on which impedance boundary conditions are imposed) is studied. This consideration is important because the point source is regarded as fundamental radiating device. The two independent problems are solved by a method due to Jones based on the Wiener-Hopf technique.

Original language	English
Pages (from-to)	28-38
Number of pages	11
Journal	Optica Applicata
Volume	27
Issue number	1
State	Published - 1997
Externally published	Yes

Cite this

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title = "Point source scattering by a metallic half-plane",

abstract = "The diffraction of an E-polarized and an H-polarized spherical wave (emanating from a point source) by an imperfectly conducting half-plane (on which impedance boundary conditions are imposed) is studied. This consideration is important because the point source is regarded as fundamental radiating device. The two independent problems are solved by a method due to Jones based on the Wiener-Hopf technique.",

author = "S. Asghar and Tasawar Hayat",

year = "1997",

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AU - Asghar, S.

AU - Hayat, Tasawar

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N2 - The diffraction of an E-polarized and an H-polarized spherical wave (emanating from a point source) by an imperfectly conducting half-plane (on which impedance boundary conditions are imposed) is studied. This consideration is important because the point source is regarded as fundamental radiating device. The two independent problems are solved by a method due to Jones based on the Wiener-Hopf technique.

AB - The diffraction of an E-polarized and an H-polarized spherical wave (emanating from a point source) by an imperfectly conducting half-plane (on which impedance boundary conditions are imposed) is studied. This consideration is important because the point source is regarded as fundamental radiating device. The two independent problems are solved by a method due to Jones based on the Wiener-Hopf technique.

UR - https://www.scopus.com/pages/publications/0031385627

M3 - Article

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SN - 0078-5466

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SP - 28

EP - 38

JO - Optica Applicata

JF - Optica Applicata

IS - 1

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Point source scattering by a metallic half-plane

Abstract

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