@inproceedings{e7af184365a645f798c54e318ded5f4e,
title = "Optimization of out-of-band impedance environment for linearity improvements of microwave power transistors",
abstract = "This paper introduces a novel method that allows the presentation of specific, broadband impedances to a DUT by loadpull. To investigate this method, a derivative of class J power amplifier termed BJ is emulated, which effectively lies between class J and class B along the reactive routes on the Smith chart. The mode helps explore baseband linearization approach and its suitability when using continuous mode architectures. Adopting out-of-band impedance optimization technique allows to present impedances and move progressively from a completely real set of loads to completely imaginary set of loads in a deterministic and systematic way. This further extends a view to look at how well the emulated mode linearizes at a set of BJ contour points along the way. The method uses multiple modulated signal sources, phase synchronized at both radio frequency (RF) and intermediate frequency (IF) to provide a complete multi-harmonic broadband loadpull capability controlled by a single local oscillator and allows complete impedance control at the DUT current generator plane.",
keywords = "broadband impedance, harmonic loadpull, measurements, phase coherence, power amplifiers",
author = "Chaudhary, \{Muhammad Akmal\} and Memon, \{Zulfiqar Ali\} and Zubaida Yusoff and Jonathan Lees and Johannes Benedikt and Paul Tasker",
note = "Publisher Copyright: {\textcopyright} 2018 IEEE.; 5th International Conference on Electrical and Electronics Engineering, ICEEE 2018 ; Conference date: 03-05-2018 Through 05-05-2018",
year = "2018",
month = jun,
day = "20",
doi = "10.1109/ICEEE2.2018.8391334",
language = "English",
series = "2018 5th International Conference on Electrical and Electronics Engineering, ICEEE 2018",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
pages = "219--223",
booktitle = "2018 5th International Conference on Electrical and Electronics Engineering, ICEEE 2018",
address = "United States",
}