Optical properties of CdS thin films

M. Gilic; J. Trajic; N. Romcevic; M. Romcevic; D. V. Timotijevic; G. Stanisic; I. S. Yahia

doi:10.1016/j.optmat.2012.12.028

Optical properties of CdS thin films

M. Gilic
, J. Trajic
, N. Romcevic
, M. Romcevic
, D. V. Timotijevic
, G. Stanisic
, I. S. Yahia

University of Belgrade
Ain Shams University

Research output: Contribution to journal › Article › peer-review

51 Scopus citations

Abstract

The properties of CdS thin films were investigated by applying atomic force microscopy (AFM), Raman and far-infrared spectroscopy. CdS thin films were prepared by using the thermal evaporation technique under base pressure 2 × 10^-5 torr. The quality of these films was investigated by AFM spectroscopy. We applied Raman scattering and far-infrared spectroscopy to investigate the optical properties of CdS thin films, and reveal the existence of Surface Optical Phonon (SOP) mode at 297 cm^-1. Effective permittivity of mixture was modeled by Maxwell-Garnet approximation. In the analysis of the far-infrared reflection spectra, a numerical model for calculating the reflectivity coefficient for a system which includes films and substrate was applied.

Original language	English
Pages (from-to)	1112-1117
Number of pages	6
Journal	Optical Materials
Volume	35
Issue number	5
DOIs	https://doi.org/10.1016/j.optmat.2012.12.028
State	Published - Mar 2013
Externally published	Yes

Keywords

AFM
CdS thin films
Far-infrared spectroscopy
Raman spectroscopy

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10.1016/j.optmat.2012.12.028

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@article{9beadb6ddfd347cabd671126164c7626,

title = "Optical properties of CdS thin films",

abstract = "The properties of CdS thin films were investigated by applying atomic force microscopy (AFM), Raman and far-infrared spectroscopy. CdS thin films were prepared by using the thermal evaporation technique under base pressure 2 × 10-5 torr. The quality of these films was investigated by AFM spectroscopy. We applied Raman scattering and far-infrared spectroscopy to investigate the optical properties of CdS thin films, and reveal the existence of Surface Optical Phonon (SOP) mode at 297 cm-1. Effective permittivity of mixture was modeled by Maxwell-Garnet approximation. In the analysis of the far-infrared reflection spectra, a numerical model for calculating the reflectivity coefficient for a system which includes films and substrate was applied.",

keywords = "AFM, CdS thin films, Far-infrared spectroscopy, Raman spectroscopy",

author = "M. Gilic and J. Trajic and N. Romcevic and M. Romcevic and Timotijevic, \{D. V.\} and G. Stanisic and Yahia, \{I. S.\}",

year = "2013",

month = mar,

doi = "10.1016/j.optmat.2012.12.028",

language = "English",

volume = "35",

pages = "1112--1117",

journal = "Optical Materials",

issn = "0925-3467",

publisher = "Elsevier B.V.",

number = "5",

}

TY - JOUR

T1 - Optical properties of CdS thin films

AU - Gilic, M.

AU - Trajic, J.

AU - Romcevic, N.

AU - Romcevic, M.

AU - Timotijevic, D. V.

AU - Stanisic, G.

AU - Yahia, I. S.

PY - 2013/3

Y1 - 2013/3

N2 - The properties of CdS thin films were investigated by applying atomic force microscopy (AFM), Raman and far-infrared spectroscopy. CdS thin films were prepared by using the thermal evaporation technique under base pressure 2 × 10-5 torr. The quality of these films was investigated by AFM spectroscopy. We applied Raman scattering and far-infrared spectroscopy to investigate the optical properties of CdS thin films, and reveal the existence of Surface Optical Phonon (SOP) mode at 297 cm-1. Effective permittivity of mixture was modeled by Maxwell-Garnet approximation. In the analysis of the far-infrared reflection spectra, a numerical model for calculating the reflectivity coefficient for a system which includes films and substrate was applied.

AB - The properties of CdS thin films were investigated by applying atomic force microscopy (AFM), Raman and far-infrared spectroscopy. CdS thin films were prepared by using the thermal evaporation technique under base pressure 2 × 10-5 torr. The quality of these films was investigated by AFM spectroscopy. We applied Raman scattering and far-infrared spectroscopy to investigate the optical properties of CdS thin films, and reveal the existence of Surface Optical Phonon (SOP) mode at 297 cm-1. Effective permittivity of mixture was modeled by Maxwell-Garnet approximation. In the analysis of the far-infrared reflection spectra, a numerical model for calculating the reflectivity coefficient for a system which includes films and substrate was applied.

KW - AFM

KW - CdS thin films

KW - Far-infrared spectroscopy

KW - Raman spectroscopy

UR - https://www.scopus.com/pages/publications/84875215014

U2 - 10.1016/j.optmat.2012.12.028

DO - 10.1016/j.optmat.2012.12.028

M3 - Article

AN - SCOPUS:84875215014

SN - 0925-3467

VL - 35

SP - 1112

EP - 1117

JO - Optical Materials

JF - Optical Materials

IS - 5

ER -

Optical properties of CdS thin films

Abstract

Keywords

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