Abstract
This reports on an extensive study of the characteristics of AuGe and AuGeSi liquid metal alloy ion sources as a model system for new semiconductor compatible FIB sources. Such characteristics include ion beam mass spectra. A careful investigation has been undertaken where the emitter temperature is the main variable parameter. This work concerns the temperature dependence of the mass spectra of two needle-type liquid metal alloy ion sources (LMAISs), namely Au77Ge14Si9 (Tm ≤ 364°C) and Au73Ge27 (Tm ≤ 365°C). The sources are important for producing SiGe implanted layers. The experimental results, in conjunction with existing theories, strongly points towards the co-existence of two mechanisms for the emission of doubly-charged monomer ions: direct filed-evaporation and post-ionisation.
| Original language | English |
|---|---|
| Pages (from-to) | 214-217 |
| Number of pages | 4 |
| Journal | Journal of Physics: Conference Series |
| Volume | 10 |
| Issue number | 1 |
| DOIs | |
| State | Published - 1 Jan 2005 |
| Externally published | Yes |
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