Skip to main navigation Skip to search Skip to main content

Non-linear large signal PA modelling for switching-mode operation (class-F/continuous class-F)

  • M. Paynter
  • , S. Bensmida
  • , K. A. Morris
  • , J. P. McGeehan
  • , M. Akmal
  • , J. Lees
  • , J. Benedikt
  • , P. Tasker
  • , M. Beach
  • University of Bristol
  • Cardiff University

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

4 Scopus citations

Abstract

This paper proposes a novel GaN HEMT non-linear model extraction method from small-signal cold S-parameters and large signal waveform measurements, here demonstrated in simulation. These waveform measurements are taken in simple 50 conditions, but will be shown to be suitable for switching-mode power amplifier (PA) designs. Class-F and Continuous Class-F switching modes will be demonstrated with this model and verified by comparison with existing work which uses load-pull measurements to achieve the same results.

Original languageEnglish
Title of host publicationEuropean Microwave Week 2011
Subtitle of host publication"Wave to the Future", EuMW 2011, Conference Proceedings - 6th European Microwave Integrated Circuit Conference, EuMIC 2011
Pages152-155
Number of pages4
StatePublished - 2011
Externally publishedYes
Event14th European Microwave Week 2011: "Wave to the Future", EuMW 2011 - 6th European Microwave Integrated Circuit Conference, EuMIC 2011 - Manchester, United Kingdom
Duration: 10 Oct 201111 Oct 2011

Publication series

NameEuropean Microwave Week 2011: "Wave to the Future", EuMW 2011, Conference Proceedings - 6th European Microwave Integrated Circuit Conference, EuMIC 2011

Conference

Conference14th European Microwave Week 2011: "Wave to the Future", EuMW 2011 - 6th European Microwave Integrated Circuit Conference, EuMIC 2011
Country/TerritoryUnited Kingdom
CityManchester
Period10/10/1111/10/11

Fingerprint

Dive into the research topics of 'Non-linear large signal PA modelling for switching-mode operation (class-F/continuous class-F)'. Together they form a unique fingerprint.

Cite this