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Multitone measurement system for linearity investigations of microwave devices

  • Cardiff University

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

4 Scopus citations

Abstract

This paper presents a refined multitone measurement system for the robust characterization of nonlinear microwave devices when subjected to broadband multi-tone stimuli. This refined system has the ability to present specific, constant impedances, not only to the baseband (IF) components, but also to signals located around fundamental (RF) and significant harmonic frequencies. Achieving such comprehensive impedance control across wide modulation bandwidths is important and allows the 'emulation' of new and specific modes of power amplifier operation, and the subsequent waveform characterization of microwave devices operating in such environments. The modified system is demonstrated through a number of applications: firstly the experimental investigation and baseband optimization of a 10W GaN HEMT under nine-tone excitation, and secondly, the emulation of a multitone Class-J impedance environment with optimized baseband impedance environment that interestingly highlights the presence of separate optimum baseband impedance conditions necessary for the reduction of individual Intermodulation (IM) products.

Original languageEnglish
Title of host publicationProceedings of 2017 International Multi-Topic Conference, INMIC 2017
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages1-4
Number of pages4
ISBN (Electronic)9781538623039
DOIs
StatePublished - 2 Jul 2017
Event20th International Multi-Topic Conference, INMIC 2017 - Lahore, Pakistan
Duration: 24 Nov 201726 Nov 2017

Publication series

NameProceedings of 2017 International Multi-Topic Conference, INMIC 2017
Volume2018-January

Conference

Conference20th International Multi-Topic Conference, INMIC 2017
Country/TerritoryPakistan
CityLahore
Period24/11/1726/11/17

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