Modulated waveform measurement and engineering system

Muhammad Akmal Chaudhary; Jonathan Lees; Johannes Benedikt; Paul Tasker

doi:10.1109/ICECS.2015.7440296

Modulated waveform measurement and engineering system

Muhammad Akmal Chaudhary
, Jonathan Lees
, Johannes Benedikt
, Paul Tasker

College of Engineering and Information Technology

Cardiff University

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

4 Scopus citations

Abstract

This paper presents an enhanced time-domain modulated waveform measurement and engineering system. The measurement system is based around a standard sampling oscilloscope and consists of a test set which integrates both RF and IF measurement and engineering, merging the capabilities of DC, CW, and multi-tone measurement system. The aim of the system is to extend the design role of waveform measurement and engineering into the multi-tone domain allowing optimization of power amplifiers under more realistic operating conditions akin to those found in modern day wireless systems. A GaN transistor has been measured, and results are presented that highlight the capabilities and applications of the system.

Original language	English
Title of host publication	2015 IEEE International Conference on Electronics, Circuits, and Systems, ICECS 2015
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	252-255
Number of pages	4
ISBN (Electronic)	9781509002467
DOIs	https://doi.org/10.1109/ICECS.2015.7440296
State	Published - 23 Mar 2016
Event	IEEE International Conference on Electronics, Circuits, and Systems, ICECS 2015 - Cairo, Egypt Duration: 6 Dec 2015 → 9 Dec 2015

Publication series

Name	Proceedings of the IEEE International Conference on Electronics, Circuits, and Systems
Volume	2016-March

Conference

Conference	IEEE International Conference on Electronics, Circuits, and Systems, ICECS 2015
Country/Territory	Egypt
City	Cairo
Period	6/12/15 → 9/12/15

Keywords

Active load-pull
Device Characterization
Power Amplifiers
Waveform measurements
baseband

Access to Document

10.1109/ICECS.2015.7440296

Cite this

Chaudhary, M. A., Lees, J., Benedikt, J., & Tasker, P. (2016). Modulated waveform measurement and engineering system. In 2015 IEEE International Conference on Electronics, Circuits, and Systems, ICECS 2015 (pp. 252-255). Article 7440296 (Proceedings of the IEEE International Conference on Electronics, Circuits, and Systems; Vol. 2016-March). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ICECS.2015.7440296

Chaudhary, Muhammad Akmal ; Lees, Jonathan ; Benedikt, Johannes et al. / Modulated waveform measurement and engineering system. 2015 IEEE International Conference on Electronics, Circuits, and Systems, ICECS 2015. Institute of Electrical and Electronics Engineers Inc., 2016. pp. 252-255 (Proceedings of the IEEE International Conference on Electronics, Circuits, and Systems).

@inproceedings{0aca19e303234ce29b2ba1a7a2c45fe6,

title = "Modulated waveform measurement and engineering system",

abstract = "This paper presents an enhanced time-domain modulated waveform measurement and engineering system. The measurement system is based around a standard sampling oscilloscope and consists of a test set which integrates both RF and IF measurement and engineering, merging the capabilities of DC, CW, and multi-tone measurement system. The aim of the system is to extend the design role of waveform measurement and engineering into the multi-tone domain allowing optimization of power amplifiers under more realistic operating conditions akin to those found in modern day wireless systems. A GaN transistor has been measured, and results are presented that highlight the capabilities and applications of the system.",

keywords = "Active load-pull, Device Characterization, Power Amplifiers, Waveform measurements, baseband",

author = "Chaudhary, \{Muhammad Akmal\} and Jonathan Lees and Johannes Benedikt and Paul Tasker",

note = "Publisher Copyright: {\textcopyright} 2015 IEEE.; IEEE International Conference on Electronics, Circuits, and Systems, ICECS 2015 ; Conference date: 06-12-2015 Through 09-12-2015",

year = "2016",

month = mar,

day = "23",

doi = "10.1109/ICECS.2015.7440296",

language = "English",

series = "Proceedings of the IEEE International Conference on Electronics, Circuits, and Systems",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

pages = "252--255",

booktitle = "2015 IEEE International Conference on Electronics, Circuits, and Systems, ICECS 2015",

address = "United States",

}

Chaudhary, MA, Lees, J, Benedikt, J & Tasker, P 2016, Modulated waveform measurement and engineering system. in 2015 IEEE International Conference on Electronics, Circuits, and Systems, ICECS 2015., 7440296, Proceedings of the IEEE International Conference on Electronics, Circuits, and Systems, vol. 2016-March, Institute of Electrical and Electronics Engineers Inc., pp. 252-255, IEEE International Conference on Electronics, Circuits, and Systems, ICECS 2015, Cairo, Egypt, 6/12/15. https://doi.org/10.1109/ICECS.2015.7440296

Modulated waveform measurement and engineering system. / Chaudhary, Muhammad Akmal; Lees, Jonathan; Benedikt, Johannes et al.
2015 IEEE International Conference on Electronics, Circuits, and Systems, ICECS 2015. Institute of Electrical and Electronics Engineers Inc., 2016. p. 252-255 7440296 (Proceedings of the IEEE International Conference on Electronics, Circuits, and Systems; Vol. 2016-March).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - Modulated waveform measurement and engineering system

AU - Chaudhary, Muhammad Akmal

AU - Lees, Jonathan

AU - Benedikt, Johannes

AU - Tasker, Paul

PY - 2016/3/23

Y1 - 2016/3/23

N2 - This paper presents an enhanced time-domain modulated waveform measurement and engineering system. The measurement system is based around a standard sampling oscilloscope and consists of a test set which integrates both RF and IF measurement and engineering, merging the capabilities of DC, CW, and multi-tone measurement system. The aim of the system is to extend the design role of waveform measurement and engineering into the multi-tone domain allowing optimization of power amplifiers under more realistic operating conditions akin to those found in modern day wireless systems. A GaN transistor has been measured, and results are presented that highlight the capabilities and applications of the system.

AB - This paper presents an enhanced time-domain modulated waveform measurement and engineering system. The measurement system is based around a standard sampling oscilloscope and consists of a test set which integrates both RF and IF measurement and engineering, merging the capabilities of DC, CW, and multi-tone measurement system. The aim of the system is to extend the design role of waveform measurement and engineering into the multi-tone domain allowing optimization of power amplifiers under more realistic operating conditions akin to those found in modern day wireless systems. A GaN transistor has been measured, and results are presented that highlight the capabilities and applications of the system.

KW - Active load-pull

KW - Device Characterization

KW - Power Amplifiers

KW - Waveform measurements

KW - baseband

UR - https://www.scopus.com/pages/publications/84964900247

U2 - 10.1109/ICECS.2015.7440296

DO - 10.1109/ICECS.2015.7440296

M3 - Conference contribution

AN - SCOPUS:84964900247

T3 - Proceedings of the IEEE International Conference on Electronics, Circuits, and Systems

SP - 252

EP - 255

BT - 2015 IEEE International Conference on Electronics, Circuits, and Systems, ICECS 2015

PB - Institute of Electrical and Electronics Engineers Inc.

T2 - IEEE International Conference on Electronics, Circuits, and Systems, ICECS 2015

Y2 - 6 December 2015 through 9 December 2015

ER -

Chaudhary MA, Lees J, Benedikt J, Tasker P. Modulated waveform measurement and engineering system. In 2015 IEEE International Conference on Electronics, Circuits, and Systems, ICECS 2015. Institute of Electrical and Electronics Engineers Inc. 2016. p. 252-255. 7440296. (Proceedings of the IEEE International Conference on Electronics, Circuits, and Systems). doi: 10.1109/ICECS.2015.7440296

Modulated waveform measurement and engineering system

Abstract

Publication series

Conference

Keywords

Access to Document

Other files and links

Fingerprint

Cite this