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High-speed device characterization using an active load-pull system and waveform engineering postulator

  • V. Carrubba
  • , A. L. Clarke
  • , S. P. Woodington
  • , W. McGenn
  • , M. Akmal
  • , A. AlMuhaisen
  • , J. Lees
  • , S. C. Cripps
  • , P. J. Tasker
  • , J. Benedikt
  • Cardiff University

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

2 Scopus citations

Abstract

This paper presents a methodology that provides rapid estimation of the parameters necessary for the high-speed characterization of transistor devices used in modern microwave power amplifiers. The key in achieving this significant measurement speed improvement is the use of a systematic waveform postulation methodology in combination with an active harmonic load-pull measurement system. The methodology is based on a rapid and systematic procedure that initially requires only a few DC measurement parameters to approximate the device's transfer characteristic and boundary conditions. Using these parameters, it is then possible to accurately estimate or postulate the idealized output current and voltage waveforms, in this case for a three harmonic Class-F mode. These waveforms are rich in information and provide harmonic load impedances as well as other key postulated parameters that can then be used to guide the harmonic active load-pull measurement system resulting in a very time-efficient characterization process.

Original languageEnglish
Title of host publication2011 77th ARFTG Microwave Measurement Conference
Subtitle of host publicationDesign and Measurement of Microwave Systems, ARFTG 2011
DOIs
StatePublished - 2011
Externally publishedYes
Event2011 77th ARFTG Microwave Measurement Conference: Design and Measurement of Microwave Systems, ARFTG 2011 - Baltimore, MD, United States
Duration: 10 Jun 201110 Jun 2011

Publication series

Name2011 77th ARFTG Microwave Measurement Conference: Design and Measurement of Microwave Systems, ARFTG 2011

Conference

Conference2011 77th ARFTG Microwave Measurement Conference: Design and Measurement of Microwave Systems, ARFTG 2011
Country/TerritoryUnited States
CityBaltimore, MD
Period10/06/1110/06/11

Keywords

  • Microwave devices
  • microwave measurements
  • parameter estimation
  • power amplifiers
  • predictive models

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