Far-infrared investigations of the surface modes in CdS thin films

J. Trajić; M. Gilić; N. Romčević; M. Romčević; G. Stanišić; Z. Lazarević; D. Joksimović; I. S. Yahia

doi:10.1088/0031-8949/2014/T162/014031

Far-infrared investigations of the surface modes in CdS thin films

J. Trajić
, M. Gilić
, N. Romčević
, M. Romčević
, G. Stanišić
, Z. Lazarević
, D. Joksimović
, I. S. Yahia

University of Belgrade
Megatrend University
Ain Shams University

Research output: Contribution to journal › Conference article › peer-review

3 Scopus citations

Abstract

The properties of Cadmium sulphide (CdS) thin films were investigated by applying atomic force microscopy (AFM) and far-infrared spectroscopy. CdS thin films were prepared using thermal evaporation technique under a base pressure of 2×10^-5torr. The quality of these films was investigated by AFM spectroscopy. We apply far-infrared spectroscopy to investigate the optical properties of CdS thin films, and reveal the existence of a surface optical phonon (SOP) mode at 297 cm^-1. For the first time, the dielectric function of CdS thin film is modeled as a mixture of homogenous spherical inclusions in air by the Maxwell-Garnet formula. In the analysis of the far-infrared reflection spectra, a numerical model for calculating the reflectivity coefficient for a system which includes films and substrates has been applied.

Original language	English
Article number	014031
Journal	Physica Scripta Topical Issues
Volume	T162
DOIs	https://doi.org/10.1088/0031-8949/2014/T162/014031
State	Published - 1 Sep 2014
Externally published	Yes
Event	4th International School and Conference on Photonics, PHOTONICA 2013 - Belgrade, Serbia Duration: 26 Aug 2013 → 30 Aug 2013

Keywords

AFM
CdS thin films
Raman spectroscopy
far-infrared spectroscopy

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10.1088/0031-8949/2014/T162/014031

Cite this

@article{3c9f7f75be964152b7e9cd67567d34df,

title = "Far-infrared investigations of the surface modes in CdS thin films",

abstract = "The properties of Cadmium sulphide (CdS) thin films were investigated by applying atomic force microscopy (AFM) and far-infrared spectroscopy. CdS thin films were prepared using thermal evaporation technique under a base pressure of 2{\texttimes}10-5torr. The quality of these films was investigated by AFM spectroscopy. We apply far-infrared spectroscopy to investigate the optical properties of CdS thin films, and reveal the existence of a surface optical phonon (SOP) mode at 297 cm-1. For the first time, the dielectric function of CdS thin film is modeled as a mixture of homogenous spherical inclusions in air by the Maxwell-Garnet formula. In the analysis of the far-infrared reflection spectra, a numerical model for calculating the reflectivity coefficient for a system which includes films and substrates has been applied.",

keywords = "AFM, CdS thin films, Raman spectroscopy, far-infrared spectroscopy",

author = "J. Traji{\'c} and M. Gili{\'c} and N. Rom{\v c}evi{\'c} and M. Rom{\v c}evi{\'c} and G. Stani{\v s}i{\'c} and Z. Lazarevi{\'c} and D. Joksimovi{\'c} and Yahia, \{I. S.\}",

note = "Publisher Copyright: {\textcopyright} 2014 The Royal Swedish Academy of Sciences.; 4th International School and Conference on Photonics, PHOTONICA 2013 ; Conference date: 26-08-2013 Through 30-08-2013",

year = "2014",

month = sep,

day = "1",

doi = "10.1088/0031-8949/2014/T162/014031",

language = "English",

volume = "T162",

journal = "Physica Scripta Topical Issues",

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TY - JOUR

T1 - Far-infrared investigations of the surface modes in CdS thin films

AU - Trajić, J.

AU - Gilić, M.

AU - Romčević, N.

AU - Romčević, M.

AU - Stanišić, G.

AU - Lazarević, Z.

AU - Joksimović, D.

AU - Yahia, I. S.

PY - 2014/9/1

Y1 - 2014/9/1

N2 - The properties of Cadmium sulphide (CdS) thin films were investigated by applying atomic force microscopy (AFM) and far-infrared spectroscopy. CdS thin films were prepared using thermal evaporation technique under a base pressure of 2×10-5torr. The quality of these films was investigated by AFM spectroscopy. We apply far-infrared spectroscopy to investigate the optical properties of CdS thin films, and reveal the existence of a surface optical phonon (SOP) mode at 297 cm-1. For the first time, the dielectric function of CdS thin film is modeled as a mixture of homogenous spherical inclusions in air by the Maxwell-Garnet formula. In the analysis of the far-infrared reflection spectra, a numerical model for calculating the reflectivity coefficient for a system which includes films and substrates has been applied.

AB - The properties of Cadmium sulphide (CdS) thin films were investigated by applying atomic force microscopy (AFM) and far-infrared spectroscopy. CdS thin films were prepared using thermal evaporation technique under a base pressure of 2×10-5torr. The quality of these films was investigated by AFM spectroscopy. We apply far-infrared spectroscopy to investigate the optical properties of CdS thin films, and reveal the existence of a surface optical phonon (SOP) mode at 297 cm-1. For the first time, the dielectric function of CdS thin film is modeled as a mixture of homogenous spherical inclusions in air by the Maxwell-Garnet formula. In the analysis of the far-infrared reflection spectra, a numerical model for calculating the reflectivity coefficient for a system which includes films and substrates has been applied.

KW - AFM

KW - CdS thin films

KW - Raman spectroscopy

KW - far-infrared spectroscopy

UR - https://www.scopus.com/pages/publications/84907298178

U2 - 10.1088/0031-8949/2014/T162/014031

DO - 10.1088/0031-8949/2014/T162/014031

M3 - Conference article

AN - SCOPUS:84907298178

VL - T162

JO - Physica Scripta Topical Issues

JF - Physica Scripta Topical Issues

M1 - 014031

T2 - 4th International School and Conference on Photonics, PHOTONICA 2013

Y2 - 26 August 2013 through 30 August 2013

ER -

Far-infrared investigations of the surface modes in CdS thin films

Abstract

Keywords

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