Skip to main navigation Skip to search Skip to main content

Electrical and photoconductivity properties of p-Si/P3HT/Al and p-Si/P3HT:MEH-PPV/Al organic devices: Comparison study

  • Mus Alparslan University
  • Ain Shams University
  • Firat University

Research output: Contribution to journalArticlepeer-review

87 Scopus citations

Abstract

The electrical and photoresponse properties of the p-Si/P3HT/Al and p-Si/P3HT:MEH-PPV/Al organic devices have been investigated by current-voltage and capacitance-voltage characteristics. The diode parameters such as ideality factor, barrier height, rectification ratio, Richardson constant, and series resistance were determined from current-voltage characteristics at different temperatures. The diodes indicate a non-ideal current-voltage behavior due to the ideality factor being higher than unity due to the effect of series resistance and the presence of an interfacial layer. The interface state density D it values of the P3HT and P3HT:MEH-PPV diodes vary from 1.829 × 10 10 to 3.825 × 10 11 eV -1 cm -2 and from 4.561 × 10 11 to 3.233 × 10 12 eV -1 cm -2, respectively. The photoconductivity properties of the diodes under various illuminations have been investigated. The photoconductivity parameters of the P3HT:MEH-PPV diode are higher than that of photoconductivity parameters of the P3HT diode.

Original languageEnglish
Pages (from-to)41-57
Number of pages17
JournalMicroelectronic Engineering
Volume98
DOIs
StatePublished - Oct 2012
Externally publishedYes

Keywords

  • I-V and C-V measurements
  • Interface state density
  • Organic Schottky diode
  • P3HT and MEH-PPV organic semiconductors
  • Photoconductivity properties
  • Rectification ratio

Fingerprint

Dive into the research topics of 'Electrical and photoconductivity properties of p-Si/P3HT/Al and p-Si/P3HT:MEH-PPV/Al organic devices: Comparison study'. Together they form a unique fingerprint.

Cite this