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Drain current model for thin body undoped and lightly doped double-gate MOSFETs

  • Zewail City of Science and Technology
  • American University in Cairo
  • Universidad Rovira i Virgili
  • McMaster University

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

In this work, we incorporate quantum physics to develop analytical models for doped and undoped, thin-body DG FETs. An explicit current model has been introduced in terms of both source and drain charge densities at which hole and electron quasi-Fermi level or IMREFs are defined. Our compact models, with no fitting parameters, give good predictions of the quantum volume inversion charge and drain current. These models have been verified with self-consistent results form numerical calculations of the coupled Poission-Schrodinger equations. An important consequence of new compact models can be inserted into simulation programs such as SPICE, thus overcoming limitations when only classical physics is used.

Original languageEnglish
Title of host publicationTechnical Proceedings of the 2014 NSTI Nanotechnology Conference and Expo, NSTI-Nanotech 2014
PublisherNano Science and Technology Institute
Pages459-462
Number of pages4
ISBN (Print)9781482258271
StatePublished - 2014
Externally publishedYes
EventNanotechnology 2014: MEMS, Fluidics, Bio Systems, Medical, Computational and Photonics - 2014 NSTI Nanotechnology Conference and Expo, NSTI-Nanotech 2014 - Washington, DC, United States
Duration: 15 Jun 201418 Jun 2014

Publication series

NameTechnical Proceedings of the 2014 NSTI Nanotechnology Conference and Expo, NSTI-Nanotech 2014
Volume2

Conference

ConferenceNanotechnology 2014: MEMS, Fluidics, Bio Systems, Medical, Computational and Photonics - 2014 NSTI Nanotechnology Conference and Expo, NSTI-Nanotech 2014
Country/TerritoryUnited States
CityWashington, DC
Period15/06/1418/06/14

Keywords

  • Double gate MOSFET
  • Drain current
  • Inversion charge
  • Quantum mechanical
  • Undoped

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