Diffused reflectance and structure analysis for the nano-matrix (ZnO (1-x)SiO2(x)) system

M. Hafez; I. S. Yahia; S. Taha

doi:10.1016/j.saa.2014.02.094

Diffused reflectance and structure analysis for the nano-matrix (ZnO _(1-x)SiO_2(x)) system

M. Hafez
, I. S. Yahia
, S. Taha

Cairo University
Ain Shams University
King Khalid University
Al-Fayoum University

Research output: Contribution to journal › Article › peer-review

26 Scopus citations

Abstract

Optical and structural properties of the investigated matrix ZnO _(1-x)SiO_2(x) system were characterized by various techniques such as X-ray analysis and UV-VIS-NIR absorption. The structural changes of the studied nano-matrix ZnO_(1-x)SiO_2(x ₎ with the concentration of nanosilica are checked by X-ray analysis measurement. The crystal structures for ZnO, (ZnO)_0.75(SiO ₂)_0.25, (ZnO)_0.50(SiO₂) _0.50 and (ZnO)_0.25(SiO₂)_0.75 and pure SiO₂ are hexagonal, monoclinic, tetragonal, orthorhombic and amorphous respectively and detailed crystal parameters are obtained. The electronic properties of ZnO_(1-x)SiO _2(x) are investigated, where the optical band gaps for the five studied systems are 3.22 eV, 3.24 eV, 3.27 eV, 3.30 eV and 4.5 eV respectively. It is clear that the band gap increases with increasing SiO₂ content. Mixing the ZnO with SiO₂ enhance the UV response of these materials which is confirmed by diffused reflectance spectrum used to analyze the UV response of the studied systems.

Original language	English
Pages (from-to)	521-529
Number of pages	9
Journal	Spectrochimica Acta - Part A: Molecular and Biomolecular Spectroscopy
Volume	127
DOIs	https://doi.org/10.1016/j.saa.2014.02.094
State	Published - 5 Jun 2014
Externally published	Yes

Keywords

Diffused reflectance
Structural analysis

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10.1016/j.saa.2014.02.094

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title = "Diffused reflectance and structure analysis for the nano-matrix (ZnO (1-x)SiO2(x)) system",

abstract = "Optical and structural properties of the investigated matrix ZnO (1-x)SiO2(x) system were characterized by various techniques such as X-ray analysis and UV-VIS-NIR absorption. The structural changes of the studied nano-matrix ZnO(1-x)SiO2(x ) with the concentration of nanosilica are checked by X-ray analysis measurement. The crystal structures for ZnO, (ZnO)0.75(SiO 2)0.25, (ZnO)0.50(SiO2) 0.50 and (ZnO)0.25(SiO2)0.75 and pure SiO2 are hexagonal, monoclinic, tetragonal, orthorhombic and amorphous respectively and detailed crystal parameters are obtained. The electronic properties of ZnO(1-x)SiO 2(x) are investigated, where the optical band gaps for the five studied systems are 3.22 eV, 3.24 eV, 3.27 eV, 3.30 eV and 4.5 eV respectively. It is clear that the band gap increases with increasing SiO2 content. Mixing the ZnO with SiO2 enhance the UV response of these materials which is confirmed by diffused reflectance spectrum used to analyze the UV response of the studied systems.",

keywords = "Diffused reflectance, Structural analysis",

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T1 - Diffused reflectance and structure analysis for the nano-matrix (ZnO (1-x)SiO2(x)) system

AU - Hafez, M.

AU - Yahia, I. S.

AU - Taha, S.

PY - 2014/6/5

Y1 - 2014/6/5

N2 - Optical and structural properties of the investigated matrix ZnO (1-x)SiO2(x) system were characterized by various techniques such as X-ray analysis and UV-VIS-NIR absorption. The structural changes of the studied nano-matrix ZnO(1-x)SiO2(x ) with the concentration of nanosilica are checked by X-ray analysis measurement. The crystal structures for ZnO, (ZnO)0.75(SiO 2)0.25, (ZnO)0.50(SiO2) 0.50 and (ZnO)0.25(SiO2)0.75 and pure SiO2 are hexagonal, monoclinic, tetragonal, orthorhombic and amorphous respectively and detailed crystal parameters are obtained. The electronic properties of ZnO(1-x)SiO 2(x) are investigated, where the optical band gaps for the five studied systems are 3.22 eV, 3.24 eV, 3.27 eV, 3.30 eV and 4.5 eV respectively. It is clear that the band gap increases with increasing SiO2 content. Mixing the ZnO with SiO2 enhance the UV response of these materials which is confirmed by diffused reflectance spectrum used to analyze the UV response of the studied systems.

AB - Optical and structural properties of the investigated matrix ZnO (1-x)SiO2(x) system were characterized by various techniques such as X-ray analysis and UV-VIS-NIR absorption. The structural changes of the studied nano-matrix ZnO(1-x)SiO2(x ) with the concentration of nanosilica are checked by X-ray analysis measurement. The crystal structures for ZnO, (ZnO)0.75(SiO 2)0.25, (ZnO)0.50(SiO2) 0.50 and (ZnO)0.25(SiO2)0.75 and pure SiO2 are hexagonal, monoclinic, tetragonal, orthorhombic and amorphous respectively and detailed crystal parameters are obtained. The electronic properties of ZnO(1-x)SiO 2(x) are investigated, where the optical band gaps for the five studied systems are 3.22 eV, 3.24 eV, 3.27 eV, 3.30 eV and 4.5 eV respectively. It is clear that the band gap increases with increasing SiO2 content. Mixing the ZnO with SiO2 enhance the UV response of these materials which is confirmed by diffused reflectance spectrum used to analyze the UV response of the studied systems.

KW - Diffused reflectance

KW - Structural analysis

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DO - 10.1016/j.saa.2014.02.094

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JO - Spectrochimica Acta - Part A: Molecular and Biomolecular Spectroscopy

JF - Spectrochimica Acta - Part A: Molecular and Biomolecular Spectroscopy

ER -

Diffused reflectance and structure analysis for the nano-matrix (ZnO _(1-x)SiO_2(x)) system

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Keywords

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