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Design and characterisation of ultra-low-power SOI-CMOS IC temperature level detector

  • M. Assaad
  • , E. Boufouss
  • , P. Gérard
  • , L. Francis
  • , D. Flandre
  • Petronas
  • Université catholique de Louvain

Research output: Contribution to journalArticlepeer-review

3 Scopus citations

Abstract

Described are the design and characterisation of an ultra-low-power temperature level detector (TLD) and temperature sensor based on a silicon-on-insulator (SOI) CMOS integrated circuit (IC) for harsh environment applications. Since this IC is mainly for harsh environment applications (e.g. high temperatures and radiations), it has been designed and manufactured using the 1m high-temperature SOI-CMOS technology provided by X-FAB. The measured power dissipation of the TLD circuit is 9W at a supply voltage of 5 V and temperature of 27 °C, according to the measurement results of the manufactured design.

Original languageEnglish
Pages (from-to)842-844
Number of pages3
JournalElectronics Letters
Volume48
Issue number14
DOIs
StatePublished - 5 Jul 2012
Externally publishedYes

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