@inproceedings{185f42b1ae1a4321b851eace2b12bfe8,
title = "Characterization of baseband electrical memory in microwave devices using multi-tone measurement system",
abstract = "This paper presents the robust characterization of nonlinear microwave devices driven by broadband modulated multi-sine stimuli by using a refined multi-tone waveform measurement system. The substantial contribution comes from the capability of the measurement system to measure and average the time domain waveforms of adjacently modulated signals on a similar time scale for different modulation frequencies. The enhanced system demonstrates the ability of presenting the constant baseband (IF) loads across wide modulation bandwidth which is extremely imperative for the precise evaluation of inherent nonlinearity of microwave devices. The measurement system is later applied for the experimental investigations of baseband impedance variation effects on 10W GaN HEMT through the optimization scheme based on the simultaneously engineering of significant baseband components(IF1 and IF2) and higher baseband components(IF3 and IF4).",
keywords = "Active load-pull, adjacent channel power ratio, baseband, memory effects, power amplifiers",
author = "Chaudhary, \{Muhammad Akmal\} and Memon, \{Zulifqar Ali\} and Zubaida Yusoff and Jonathon Lees and Johannes Benedikt and Paul Tasker",
note = "Publisher Copyright: {\textcopyright} 2016 IEEE.; 16th Mediterranean Microwave Symposium, MMS 2016 ; Conference date: 13-11-2016 Through 15-11-2016",
year = "2016",
month = jul,
day = "2",
doi = "10.1109/MMS.2016.7803811",
language = "English",
series = "Mediterranean Microwave Symposium",
publisher = "IEEE Computer Society",
booktitle = "2016 16th Mediterranean Microwave Symposium, MMS 2016",
address = "United States",
}