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Characterization of a Compact Wideband Microwave Metasurface Lens for Cryogenic Applications

  • Ali Al-Moathin
  • , Mingyan Zhong
  • , Qusay Al-Taai
  • , Yunan Jiang
  • , Michael Farage
  • , Jalil Ur Rehman Kazim
  • , Muhammad Zulfiqar Ali
  • , Fatemeh Nikbakhtnasrabadi
  • , Megan Powell
  • , Prince Khatri
  • , Manoj Stanley
  • , Alessandro Rossi
  • , Hadi Heidari
  • , Muhammad Ali Imran
  • , Qammer H. Abbasi
  • , Nick M. Ridler
  • , Martin Weides
  • , Chong Li
  • University of Glasgow
  • Oxford Instruments Group Plc
  • University of Strathclyde
  • National Physical Laboratory

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

3 Scopus citations

Abstract

In this paper, we present characterization of a compact flat microwave lens operating between 6 GHz and 14 GHz using a near field scanning system. An X-band horn antenna and open-end rectangular waveguide were used as an illumination source and probe, respectively. |S21| is measured as the probe antenna moves on a plane orthogonal to the optical axis vertically and horizontally. The lens is made of a metasurface layer that is sandwiched by two layers of cross-oriented gratings. The overall dimension of the lens is 10 cm in diameter and 0.57 cm in thickness. The measurement results show that the lens's focal length is 8 cm, and the beamwidth (full width at half maximum (FWHM)) is 3.5 cm, A transmission efficiency of over 90% and a cross-polarization gain of 25 dB were achieved over the entire bandwidth. The measurement results at room temperature are in good agreement with numerical simulations. The proposed lens will be used in a cryogenic environment e.g. dilution refrigerators for quantum computing systems. More results at cryogenic temperature e.g, below 30 K will be shown at the conference.

Original languageEnglish
Title of host publication101st ARFTG Microwave Measurement Conference
Subtitle of host publicationChallenges in Complex Measurement Environments, ARFTG 2023
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9798350323450
DOIs
StatePublished - 2023
Externally publishedYes
Event101st ARFTG Microwave Measurement Conference, ARFTG 2023 - San Diego, United States
Duration: 16 Jun 2023 → …

Publication series

Name101st ARFTG Microwave Measurement Conference: Challenges in Complex Measurement Environments, ARFTG 2023

Conference

Conference101st ARFTG Microwave Measurement Conference, ARFTG 2023
Country/TerritoryUnited States
CitySan Diego
Period16/06/23 → …

Keywords

  • Broadband
  • Lens
  • Metasurface
  • X-band

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