Skip to main navigation Skip to search Skip to main content

Characteristics of erbium-ions-producing liquid metal ions sources

  • National and Kapodistrian University of Athens
  • Helmholtz-Zentrum Dresden-Rossendorf

Research output: Contribution to journalConference articlepeer-review

7 Scopus citations

Abstract

Focused ion beams (FIBs) are of importance as direct write tools in the microelectronics industry, and beams containing Er ions are of importance for optoelectronics applications. Microstructures doped with Er are attractive because of their intra-4f transition of Er3+ at a wavelength of 1.54μm, which corresponds to the minimum of attenuation of optical wave-guides. We describe the electric characteristics and mass spectra of two liquid metal alloy ion sources; namely Er70Fe22Cr 3Ni5 and Er69Ni31. For the first time in the literature the energy spread of triply charged ions (Er 3+) is reported.

Original languageEnglish
Pages (from-to)1166-1170
Number of pages5
JournalPhysica B: Condensed Matter
Volume340-342
DOIs
StatePublished - 31 Dec 2003
Externally publishedYes
EventProceedings of the 22nd International Conference on Defects in (ICDS-22) - Aarhus, Denmark
Duration: 28 Jul 20031 Aug 2003

Keywords

  • Electric characteristics
  • Liquid metal ion sources
  • Microelectronics

Fingerprint

Dive into the research topics of 'Characteristics of erbium-ions-producing liquid metal ions sources'. Together they form a unique fingerprint.

Cite this