TY - GEN
T1 - Analysis of multilayer graphene as verification standard for VNA at millimeter-wave frequencies
AU - Shoaib, Nosherwan
AU - Abbasi, Qammer H.
N1 - Publisher Copyright:
© 2019 IEEE.
PY - 2019/5
Y1 - 2019/5
N2 - This paper presents the preliminary study on the analysis of multilayer graphene to demonstrate the possibility of using it as a verification standard to validate the vector network analyzer (VNA) calibration at millimeter-wave frequencies. The investigation is carried out using WR-03, WR-02, WR-1.5 and WR-01 waveguide flanges. It is observed that the multilayer graphene section can provide significant transmission attenuation to access the VNA performance operating at millimeter-wave frequencies. In addition, the effects of parametric variations of graphene section on transmission losses are also presented and discussed.
AB - This paper presents the preliminary study on the analysis of multilayer graphene to demonstrate the possibility of using it as a verification standard to validate the vector network analyzer (VNA) calibration at millimeter-wave frequencies. The investigation is carried out using WR-03, WR-02, WR-1.5 and WR-01 waveguide flanges. It is observed that the multilayer graphene section can provide significant transmission attenuation to access the VNA performance operating at millimeter-wave frequencies. In addition, the effects of parametric variations of graphene section on transmission losses are also presented and discussed.
KW - Graphene
KW - Millimeter-waves
KW - Rectangular waveguide
KW - Scattering parameters
KW - Verification standards
UR - https://www.scopus.com/pages/publications/85072837599
U2 - 10.1109/I2MTC.2019.8826897
DO - 10.1109/I2MTC.2019.8826897
M3 - Conference contribution
AN - SCOPUS:85072837599
T3 - I2MTC 2019 - 2019 IEEE International Instrumentation and Measurement Technology Conference, Proceedings
BT - I2MTC 2019 - 2019 IEEE International Instrumentation and Measurement Technology Conference, Proceedings
T2 - 2019 IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2019
Y2 - 20 May 2019 through 23 May 2019
ER -