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An Envelope Domain Probe into Nonlinear Behaviour of a High Frequency Power Transistor

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Abstract

This paper reports on precise evaluation of nonlinear behavior of a high frequency power transistor by expanding waveform measurement and engineering capabilities into the modulated envelope domain. Real time modulated measurements to capture all the spectral information including Direct Current (DC), Intermediate Frequency (IF) and Radio Frequency (RF) spectra, critical to rebuild the modulation envelopes are performed on 10W GaN HEMT under modulated excitation. Analysis is performed on measured data in envelope domain to uncover the performance of the high frequency power transistor, which highlights the significance of the robust characterization and measurements of the device for future wireless communication systems.

Original languageEnglish
Title of host publicationProceedings - 2020 IEEE International Conference on Semiconductor Electronics, ICSE 2020
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages37-40
Number of pages4
ISBN (Electronic)9781728159676
DOIs
StatePublished - Jul 2020
Event14th IEEE International Conference on Semiconductor Electronics, ICSE 2020 - Kuala Lumpur, Malaysia
Duration: 28 Jul 202029 Jul 2020

Publication series

NameIEEE International Conference on Semiconductor Electronics, Proceedings, ICSE
Volume2020-July

Conference

Conference14th IEEE International Conference on Semiconductor Electronics, ICSE 2020
Country/TerritoryMalaysia
CityKuala Lumpur
Period28/07/2029/07/20

Keywords

  • envelope domain
  • hysteresis
  • modulated measurements
  • nonlinearity
  • power transistor

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