TY - GEN
T1 - An enhanced modulated waveform measurement system for the robust characterization of microwave devices under modulated excitation
AU - Akmal, M.
AU - Lees, J.
AU - Jiangtao, S.
AU - Carrubba, V.
AU - Yusoff, Z.
AU - Woodington, S.
AU - Benedikt, J.
AU - Tasker, P. J.
AU - Bensmida, S.
AU - Morris, K.
AU - Beach, M.
AU - McGeehan, J.
PY - 2011
Y1 - 2011
N2 - This paper presents a refined modulated waveform measurement system for the robust characterization of nonlinear microwave devices when driven by broadband multi-tone stimuli. This enhanced system has the ability to present specific, constant impedances, not only to a large number of baseband (IF) components, but also to signals located around the carrier and significant harmonic frequencies. Achieving such comprehensive impedance control across wide modulation bandwidths is critical in allowing the emulation of new power amplifier modes and architectures, and the subsequent waveform characterization of devices operating in these complex and often dynamic impedance environments. The enhanced system is demonstrated through a number of applications: firstly the experimental investigation and baseband optimization of a 10W GaN HEMT under nine-tone excitation, and secondly, the emulation of a modulated Class-J impedance environment that interestingly highlights the presence of separate optimum baseband impedance conditions necessary for the reduction of individual IM products.
AB - This paper presents a refined modulated waveform measurement system for the robust characterization of nonlinear microwave devices when driven by broadband multi-tone stimuli. This enhanced system has the ability to present specific, constant impedances, not only to a large number of baseband (IF) components, but also to signals located around the carrier and significant harmonic frequencies. Achieving such comprehensive impedance control across wide modulation bandwidths is critical in allowing the emulation of new power amplifier modes and architectures, and the subsequent waveform characterization of devices operating in these complex and often dynamic impedance environments. The enhanced system is demonstrated through a number of applications: firstly the experimental investigation and baseband optimization of a 10W GaN HEMT under nine-tone excitation, and secondly, the emulation of a modulated Class-J impedance environment that interestingly highlights the presence of separate optimum baseband impedance conditions necessary for the reduction of individual IM products.
UR - https://www.scopus.com/pages/publications/84855772513
M3 - Conference contribution
AN - SCOPUS:84855772513
SN - 9782874870231
T3 - European Microwave Week 2011: "Wave to the Future", EuMW 2011, Conference Proceedings - 6th European Microwave Integrated Circuit Conference, EuMIC 2011
SP - 180
EP - 183
BT - European Microwave Week 2011
T2 - 14th European Microwave Week 2011: "Wave to the Future", EuMW 2011 - 6th European Microwave Integrated Circuit Conference, EuMIC 2011
Y2 - 10 October 2011 through 11 October 2011
ER -